Publication:
Polarization phase shifting for thickness measurement of NiO material transport layer using Sagnac interferometer

Simple item page
dc.contributor.correspondenceUsman A.
dc.contributor.otherSrinakharinwirot University
dc.date.accessioned2025-05-28T07:56:30Z
dc.date.issued2023-01-01
dc.date.issuedBE2566-01-01
dc.identifier.citationProceedings of SPIE - The International Society for Optical Engineering Vol.12672 (2023)
dc.identifier.doi10.1117/12.2678176
dc.identifier.eissn1996756X
dc.identifier.issn0277786X
dc.identifier.scopus2-s2.0-85176499245
dc.identifier.urihttps://hdl.handle.net/20.500.14740/20829
dc.rights.holderSCOPUS
dc.subjectPhysics and Astronomy
dc.subjectEngineering
dc.subjectComputer Science
dc.subjectMaterials Science
dc.subjectMathematics
dc.titlePolarization phase shifting for thickness measurement of NiO material transport layer using Sagnac interferometer
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.titleProceedings of SPIE - The International Society for Optical Engineering
oaire.citation.volume12672
oairecerif.author.affiliationKing Mongkut's University of Technology Thonburi
swu.datasource.scopushttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85176499245&origin=inward

Files

Collections

Scopus: Year 2023