Publication:
Polarization phase shifting for thickness measurement of NiO material transport layer using Sagnac interferometer

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Issued Date

2023-01-01

Resource Type

Conference Paper

ISSN

0277786X

eISSN

1996756X

DOI

10.1117/12.2678176

Scopus ID

2-s2.0-85176499245

Journal Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

12672

Rights Holder(s)

SCOPUS

Bibliographic Citation

Proceedings of SPIE - The International Society for Optical Engineering Vol.12672 (2023)

Suggested Citation

Polarization phase shifting for thickness measurement of NiO material transport layer using Sagnac interferometer. Proceedings of SPIE - The International Society for Optical Engineering Vol.12672 (2023). doi:10.1117/12.2678176 Retrieved from: https://hdl.handle.net/20.500.14740/20829

Title

Polarization phase shifting for thickness measurement of NiO material transport layer using Sagnac interferometer

Author's Affiliation

King Mongkut's University of Technology Thonburi

Corresponding Author(s)

Usman A.

Other Contributor(s)

Srinakharinwirot University

Keyword(s)

Physics and Astronomy
 Engineering
 Computer Science
 Materials Science
 Mathematics

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Journal Issue

URI

https://hdl.handle.net/20.500.14740/20829

Collections

Scopus: Year 2023

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