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EMI Filter design part II: Measurement of noise source impedances

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dc.contributor.authorTarateeraseth V.
dc.date.accessioned2021-04-05T03:34:34Z
dc.date.available2021-04-05T03:34:34Z
dc.date.issued2012
dc.date.issuedBE2555
dc.description.abstractIn the first part of the EMI filter design series, the conducted EMI generation mechanism was explained. In this second part, a method on the measurement of noise source impedance of SMPS will be described. The proposed measurement method allows accurate extraction of the common-mode and differentialmode equivalent noise source impedances of a SMPS under it actual operating conditions. © 2012 IEEE Electromagnetic Compatibility.
dc.format.mimetypeapplication/pdf
dc.identifier.citationIEEE Electromagnetic Compatibility Magazine. Vol 1, No.1 (2012), p.42-49
dc.identifier.doi10.1109/MEMC.2012.6244944
dc.identifier.issn21622264
dc.identifier.other2-s2.0-84878794761
dc.identifier.urihttps://hdl.handle.net/20.500.14740/7123
dc.rights.holderScopus
dc.subject.otherFilter banks
dc.subject.otherCommon mode
dc.subject.otherConducted EMI
dc.subject.otherDifferential mode
dc.subject.otherEMI filter design
dc.subject.otherGeneration mechanism
dc.subject.otherMeasurement methods
dc.subject.otherNoise source
dc.subject.otherOperating condition
dc.subject.otherShape memory effect
dc.titleEMI Filter design part II: Measurement of noise source impedances
dc.typeArticle
dspace.entity.typePublication
swu.datasource.scopushttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84878794761&doi=10.1109%2fMEMC.2012.6244944&partnerID=40&md5=febdbc67a5dd6e235d74f110fab0e1ec

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