Publication:
EMI Filter design part II: Measurement of noise source impedances

0
0

Issued Date

2012

Resource Type

Article

File Type

application/pdf

ISSN

21622264

DOI

10.1109/MEMC.2012.6244944

Other identifier(s)

2-s2.0-84878794761

Rights Holder(s)

Scopus

Bibliographic Citation

IEEE Electromagnetic Compatibility Magazine. Vol 1, No.1 (2012), p.42-49

Suggested Citation

Tarateeraseth V. EMI Filter design part II: Measurement of noise source impedances. IEEE Electromagnetic Compatibility Magazine. Vol 1, No.1 (2012), p.42-49. doi:10.1109/MEMC.2012.6244944 Retrieved from: https://hdl.handle.net/20.500.14740/7123

Title

EMI Filter design part II: Measurement of noise source impedances

Author(s)

Tarateeraseth V.

Abstract

In the first part of the EMI filter design series, the conducted EMI generation mechanism was explained. In this second part, a method on the measurement of noise source impedance of SMPS will be described. The proposed measurement method allows accurate extraction of the common-mode and differentialmode equivalent noise source impedances of a SMPS under it actual operating conditions. © 2012 IEEE Electromagnetic Compatibility.

Subject(s)

Filter banks
 Common mode
 Conducted EMI
 Differential mode
 EMI filter design
 Generation mechanism
 Measurement methods
 Noise source
 Operating condition
 Shape memory effect

View online Resources

Research Projects

Organizational Units

Journal Issue

URI

https://hdl.handle.net/20.500.14740/7123

Collections

Scopus: Year 1983-2021

Endorsement

Review

Supplemented By

Referenced By