Publication:
Synthesis and characterization of filtered-cathodic-vacuum-arc-deposited TiO2 films for photovoltaic applications

dc.contributor.authorAramwit C.
dc.contributor.authorIntarasiri S.
dc.contributor.authorBootkul D.
dc.contributor.authorTippawan U.
dc.contributor.authorSupsermpol B.
dc.contributor.authorSeanphinit N.
dc.contributor.authorRuangkul W.
dc.contributor.authorYu L.D.
dc.date.accessioned2021-04-05T03:33:28Z
dc.date.available2021-04-05T03:33:28Z
dc.date.issued2013
dc.date.issuedBE2556
dc.description.abstractTitanium dioxide (TiO2) is well-known as a photovoltaic and photocatalytic material. For improvement in the dye-sensitized solar cell (DSSC) performance efficiency, the photocatalyst TiO2 layer would be desired in nanoporous anatase. In this research, TiO2 films were synthesized on glass or p-type silicon substrate using our in-house Filtered Cathodic Vacuum Arc Deposition (FCVAD) system. The deposition was operated at varied oxygen (O2) partial pressures of 10-4, 10 -3, 10-2 to 10-1 torr with fixed 0 or 250-V bias and 600-V arc for 10 or 20 minutes. The film transparency increased with increasing of the O2 pressure, indicating increase in the structure required for applications in dye-sensitized solar cells. The films were characterized using the Energy-Dispersive X-ray spectroscopy (EDS) and Raman spectroscopy techniques. The EDS confirmed that the transparent deposited films contained stoichiometric titanium and oxygen under the medium O2 pressure. Raman spectra confirmed that the films were TiO2 containing some rutile but no anatase which needed annealing to form. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) were used for evaluation of the film's surface morphology and thickness. The result showed that increasing of the O2 pressure decreased the thickness to a nanoscale but increased the amount of TiO2. © IOP Publishing Ltd 2013.
dc.format.mimetypeapplication/pdf
dc.identifier.citationJournal of Physics: Conference Series. Vol 423, No.1 (2013), p.-
dc.identifier.doi10.1088/1742-6596/423/1/012005
dc.identifier.issn17426588
dc.identifier.other2-s2.0-84876847339
dc.identifier.urihttps://hdl.handle.net/20.500.14740/6828
dc.rights.holderScopus
dc.subject.otherAtomic force microscopy
dc.subject.otherDeposition
dc.subject.otherEnergy dispersive spectroscopy
dc.subject.otherNanostructured materials
dc.subject.otherOxide minerals
dc.subject.otherScanning electron microscopy
dc.subject.otherSolar cells
dc.subject.otherTitanium
dc.subject.otherTitanium dioxide
dc.subject.otherVacuum applications
dc.subject.otherVacuum technology
dc.subject.otherX ray spectroscopy
dc.subject.otherEnergy dispersive X ray spectroscopy
dc.subject.otherFiltered cathodic vacuum arc
dc.subject.otherFiltered cathodic vacuum arc deposition
dc.subject.otherNanoporous anatase
dc.subject.otherPerformance efficiency
dc.subject.otherPhotocatalytic materials
dc.subject.otherPhotovoltaic applications
dc.subject.otherSynthesis and characterizations
dc.subject.otherDye-sensitized solar cells
dc.titleSynthesis and characterization of filtered-cathodic-vacuum-arc-deposited TiO2 films for photovoltaic applications
dc.typeConference Paper
dspace.entity.typePublication
swu.datasource.scopushttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84876847339&doi=10.1088%2f1742-6596%2f423%2f1%2f012005&partnerID=40&md5=9146598672775e30812893edbc711892

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