Publication: Growth of nanostructure TiO2 films by glancing angle deposition
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Issued Date
2016
Resource Type
File Type
application/pdf
ISSN
10139826
Other identifier(s)
2-s2.0-84958225596
Rights Holder(s)
มหาวิทยาลัยศรีนครินทรวิโรฒ
Bibliographic Citation
Key Engineering Materials. Vol 675-676, (2016), p.289-292
Suggested Citation
Plirdpring T., Horprathum M., Eiamchai P., Samransuksamer B., Chananonnawathorn C., Boonpichayapha T., Kaewkao J., Kaewkhao J. Growth of nanostructure TiO2 films by glancing angle deposition. Key Engineering Materials. Vol 675-676, (2016), p.289-292. doi:10.4028/www.scientific.net/KEM.675-676.289 Retrieved from: https://hdl.handle.net/20.500.14740/5928
Abstract
Nanostructure TiO2 films were prepared by electron beam evaporation with glancing angle deposition technique at room temperature. The morphology, crystal structure and optical properties at various substrate rotation speeds (0-10 rpm) were investigated by field-emission scanning electron microscopy (FE-SEM), X-ray diffraction (XRD) and UV-vis spectrophotometer. The cross-section FE-SEM images illustrate that the nanostructures consist of different morphology: slanted columnar, spiral and vertical align nanorods at 0, 0.01 and 10 rpm-rotation speed, respectively. In particular, the rotation speed-controlled incoming vapor flux was found to play crucial role in the growth of nanostructure TiO2 films. © 2016 Trans Tech Publications, Switzerland.
Subject(s)
Crystal structure
Deposition
Enamels
Evaporation
Field emission microscopes
Morphology
Nanorods
Optical properties
Scanning electron microscopy
Electron beam evaporation
Field emission scanning electron microscopy
GLAD
Glancing Angle Deposition
Glancing angle deposition technique
Rotation speed
UV-Vis spectrophotometers
Various substrates
Titanium dioxide
Deposition
Enamels
Evaporation
Field emission microscopes
Morphology
Nanorods
Optical properties
Scanning electron microscopy
Electron beam evaporation
Field emission scanning electron microscopy
GLAD
Glancing Angle Deposition
Glancing angle deposition technique
Rotation speed
UV-Vis spectrophotometers
Various substrates
Titanium dioxide