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The features of TKE and FMR in nanocomposite-semiconductor multilayers

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dc.contributor.authorBuravtsova V.
dc.contributor.authorGan'Shina E.
dc.contributor.authorLebedeva E.
dc.contributor.authorSyr'Ev N.
dc.contributor.authorTrofimenko I.
dc.contributor.authorVyzulin S.
dc.contributor.authorShipkova I.
dc.contributor.authorPhonghirun S.
dc.contributor.authorKalinin Yu.
dc.contributor.authorSitnikov A.
dc.date.accessioned2021-04-05T03:35:44Z
dc.date.available2021-04-05T03:35:44Z
dc.date.issued2011
dc.date.issuedBE2554
dc.description.abstractMagnetic and magneto-optical properties of multilayers based on the (Co45Fe45Zr10)Z(Al2O 3)100-Z composite and amorphous hydrogenated silicon with various thicknesses both of magnetic and semiconductor layers have been investigated. The nonlinear dependence of magnetic and MO characteristics of the nanostructures on the thickness of layers was found. The interface formed on the boundary of two phases (the ferromagnetic granules and the semiconductor ones) strongly influences the magnetic and MO properties of the structures with thin Si layers.
dc.format.mimetypeapplication/pdf
dc.identifier.citationSolid State Phenomena. Vol 168-169, (2011), p.533-536
dc.identifier.doi10.4028/www.scientific.net/SSP.168-169.533
dc.identifier.issn10120394
dc.identifier.other2-s2.0-79951878861
dc.identifier.urihttps://hdl.handle.net/20.500.14740/7408
dc.rights.holderScopus
dc.subject.otherAmorphous silicon
dc.subject.otherMagnetic multilayers
dc.subject.otherMagnetos
dc.subject.otherMultilayer films
dc.subject.otherNanocomposites
dc.subject.otherNanostructured materials
dc.subject.otherNanostructures
dc.subject.otherOptical multilayers
dc.subject.otherOptical properties
dc.subject.otherPhase interfaces
dc.subject.otherSemiconducting silicon
dc.subject.otherSemiconducting silicon compounds
dc.subject.otherSemiconductor insulator boundaries
dc.subject.otherZirconium
dc.subject.otherAlumina
dc.subject.otherAluminum oxide
dc.subject.otherAmorphous silicon
dc.subject.otherFerromagnetic resonance
dc.subject.otherMagnetic multilayers
dc.subject.otherMagnetooptical effects
dc.subject.otherMultilayer films
dc.subject.otherNanostructures
dc.subject.otherOptical multilayers
dc.subject.otherOptical properties
dc.subject.otherSemiconducting silicon
dc.subject.otherSemiconductor insulator boundaries
dc.subject.otherFerromagnetic granules
dc.subject.otherFMR
dc.subject.otherHydrogenated silicon
dc.subject.otherMagnetic and magneto-optical properties
dc.subject.otherMagnetic and MO properties
dc.subject.otherMagnetic nanostructures
dc.subject.otherMagneto-optics
dc.subject.otherNonlinear dependence
dc.subject.otherSemiconductor layers
dc.subject.otherSemiconductor multilayers
dc.subject.otherSi layer
dc.subject.otherMagnetism
dc.subject.otherMagnetism
dc.titleThe features of TKE and FMR in nanocomposite-semiconductor multilayers
dc.typeConference Paper
dspace.entity.typePublication
swu.datasource.scopushttps://www.scopus.com/inward/record.uri?eid=2-s2.0-79951878861&doi=10.4028%2fwww.scientific.net%2fSSP.168-169.533&partnerID=40&md5=020c7336cc2f6fe9d4e6dd02930293f8

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