Publication: Growth of nanostructure silver films by DC magnetron sputtering for surface enhanced raman scattering substrate
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Issued Date
2016
Resource Type
File Type
application/pdf
ISSN
10139826
Other identifier(s)
2-s2.0-84958231252
Rights Holder(s)
มหาวิทยาลัยศรีนครินทรวิโรฒ
Bibliographic Citation
Key Engineering Materials. Vol 675-676, (2016), p.285-288
Suggested Citation
Tuscharoen S., Horprathum M., Eiamchai P., Nuntawong N., Chananonnawathorn C., Limnonthakul P., Kalasung S., Kaewkhao J. Growth of nanostructure silver films by DC magnetron sputtering for surface enhanced raman scattering substrate. Key Engineering Materials. Vol 675-676, (2016), p.285-288. doi:10.4028/www.scientific.net/KEM.675-676.285 Retrieved from: https://hdl.handle.net/20.500.14740/5908
Abstract
Nanostructure silver films were obtained by dc magnetron sputtering at room temperature. The influences of deposition time on the morphology and optical properties were studied by field-emission scanning electron microscope and UV-vis NIR spectrophotometer. It was found that the optical properties of the nanostructure silver film can be effect by surface morphology. The surface enhanced Raman scattering activities of nanostructure Ag films were demonstrated by methylene blue (MB) as probing molecules while the detection limit of MB was found to be as low as 10-5 M from this SERS substrate. © 2016 Trans Tech Publications, Switzerland.
Subject(s)
Aromatic compounds
Magnetron sputtering
Metallic films
Morphology
Nanostructures
Optical properties
Raman scattering
Scanning electron microscopy
Silver
Sputtering
Substrates
Surface morphology
Dc magnetron sputtering
Deposition time
Detection limits
Field emission scanning electron microscopes
Silver film
Surface enhance Raman scatterings
Surface enhanced Raman Scattering (SERS)
UV-VIS-NIR spectrophotometers
Surface scattering
Magnetron sputtering
Metallic films
Morphology
Nanostructures
Optical properties
Raman scattering
Scanning electron microscopy
Silver
Sputtering
Substrates
Surface morphology
Dc magnetron sputtering
Deposition time
Detection limits
Field emission scanning electron microscopes
Silver film
Surface enhance Raman scatterings
Surface enhanced Raman Scattering (SERS)
UV-VIS-NIR spectrophotometers
Surface scattering