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Interface roughness effect on density of states and mobility of narrow Si/Si1-xGex quantum wells: Path-integral approach

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Thongnum A., Pinsook U., Sa-Yakanit V. Interface roughness effect on density of states and mobility of narrow Si/Si1-xGex quantum wells: Path-integral approach. Journal of Physics D: Applied Physics. Vol 42, No.19 (2009), p.-. doi:10.1088/0022-3727/42/19/195101 Retrieved from: https://hdl.handle.net/20.500.14740/3836

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