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ESR and Raman studies of chemical bath deposited CdS : Ni films

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dc.contributor.authorIntatha U.
dc.contributor.authorEitssayeam S.
dc.contributor.authorPengpat K.
dc.contributor.authorUdomkan N.
dc.contributor.authorLimsuwan P.
dc.contributor.authorTunkasiri T.
dc.date.accessioned2021-04-05T04:31:58Z
dc.date.available2021-04-05T04:31:58Z
dc.date.issued2008
dc.date.issuedBE2551
dc.description.abstractThe CdS : Ni films were fabricated on glass substrates by chemical bath deposition method (CBD), where Ni concentrations are 0%, 10%, 20%, 30% and 40%. X-ray diffractometry (XRD), Raman spectroscopy and electron spin resonance (ESR) were employed to study the film structures. The XRD patterns revealed the presence of cubic CdS and trace of NiS. The Raman spectra were observed at 300 and 600 cm-1, corresponding to the first and second orders of the longitudinal optical phonon modes. Both results confirm that slightly lower order of crystallinity of CdS : Ni was found at the higher concentration of Ni. The ESR spectra showed the presence of F-type defects in CdS : Ni films. The band gaps of the samples were found to increase with the increase of Ni concentration. © 2008 World Scientific Publishing Company.
dc.format.mimetypeapplication/pdf
dc.identifier.citationModern Physics Letters B. Vol 22, No.22 (2008), p.2113-2121
dc.identifier.doi10.1142/S0217984908016741
dc.identifier.issn2179849
dc.identifier.other2-s2.0-52249085421
dc.identifier.urihttps://hdl.handle.net/20.500.14740/3937
dc.rights.holderScopus
dc.titleESR and Raman studies of chemical bath deposited CdS : Ni films
dc.typeArticle
dspace.entity.typePublication
swu.datasource.scopushttps://www.scopus.com/inward/record.uri?eid=2-s2.0-52249085421&doi=10.1142%2fS0217984908016741&partnerID=40&md5=cb702391b7a7c1e00c4d8d8375af376d

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