Please use this identifier to cite or link to this item: https://ir.swu.ac.th/jspui/handle/123456789/13825
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dc.contributor.authorChumprasert L.
dc.contributor.authorLarwongsa P.
dc.contributor.authorLimpichaipanit A.
dc.contributor.authorNgamjarurojana A.
dc.date.accessioned2021-04-05T03:32:28Z-
dc.date.available2021-04-05T03:32:28Z-
dc.date.issued2014
dc.identifier.issn10226680
dc.identifier.other2-s2.0-84904045188
dc.identifier.urihttps://ir.swu.ac.th/jspui/handle/123456789/13825-
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84904045188&doi=10.4028%2fwww.scientific.net%2fAMR.936.115&partnerID=40&md5=691b4c2f96a23e73dce281f80a8946a2
dc.description.abstractIn this paper the effect of lanthanum addition on the phase formation, dielectric and ferroelectric characteristics of x/65/35 PLZT. This ceramics were prepared using mixed-oxide synthetic route via a rapid vibro-milling method. All samples were sintered at 1200°C for 12 h. X-ray diffraction was used to observe the crystal structure. It was found that when increasing lanthanum content, the structure remained rhombohedral. It can be seen that the change of behavior to ferroelectric relaxor with the increasing of lanthanum content resulted in the change of elastic strain. © (2014) Trans Tech Publications, Switzerland.
dc.subjectCeramic materials
dc.subjectDielectric materials
dc.subjectEngineering technology
dc.subjectFerroelectric materials
dc.subjectFerroelectricity
dc.subjectMaterials science
dc.subjectSintering
dc.subjectX ray diffraction
dc.subjectChange of behavior
dc.subjectElastic strain
dc.subjectFerroelectric characteristics
dc.subjectFerroelectric relaxors
dc.subjectLanthanum additions
dc.subjectPhase formations
dc.subjectPlzt
dc.subjectSynthetic routes
dc.subjectLanthanum
dc.titleEffect of dielectric properties and elastic strain behavior on x/65/35 PLZT ceramics in lanthanum (x) ions contents
dc.typeConference Paper
dc.rights.holderScopus
dc.identifier.bibliograpycitationAdvanced Materials Research. Vol 936, (2014), p.115-118
dc.identifier.doi10.4028/www.scientific.net/AMR.936.115
Appears in Collections:Scopus 1983-2021

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