Please use this identifier to cite or link to this item: https://ir.swu.ac.th/jspui/handle/123456789/13058
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dc.contributor.authorMatra K.
dc.contributor.authorFuruta H.
dc.contributor.authorHatta A.
dc.date.accessioned2021-04-05T03:22:10Z-
dc.date.available2021-04-05T03:22:10Z-
dc.date.issued2017
dc.identifier.issn2072666X
dc.identifier.other2-s2.0-85021640391
dc.identifier.urihttps://ir.swu.ac.th/jspui/handle/123456789/13058-
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85021640391&doi=10.3390%2fmi8070211&partnerID=40&md5=caf3f60f2f6a53995a2d247287122dc9
dc.description.abstractA DC micro plasma jet for local micro deposition of a:C-H film in the ambient vacuum of scanning electron microscope (SEM) chamber is proposed. Acetylene (C2H2) gas was locally fed into the chamber through an orifice shaped gas nozzle (OGN) at 6.6 sccm in flow rate by applying 80 kPa-inlet pressure with an additional direct pumping system equipped on the SEM chamber. As a cathode, a cut of n-type silicon (Si) wafer was placed right in front of the OGN at 200 μm gap distance. By applying a positive DC voltage to the OGN, C2H2 plasma was generated locally between the electrodes. During discharge, the voltage increased and the current decreased due to deposition of insulating film on the Si wafer with resulting in automatic termination of discharge at the constant source voltage. A symmetric mountain-shaped a:C-H film of 5 μm height was deposited at the center by operation for 15 s. Films were deposited with variation of gas flow rate, gap distance, voltage and current, and deposition time. The films were directly observed by SEM and analyzed by surface profiler and by Raman spectroscopy. © 2017 by the authors.
dc.subjectElectric discharges
dc.subjectElectrodes
dc.subjectPlasma jets
dc.subjectScanning electron microscopy
dc.subjectSilicon wafers
dc.subjectThin films
dc.subjectDeposition time
dc.subjectDirect pumping
dc.subjectInlet pressures
dc.subjectInsulating film
dc.subjectMicro-plasma jet
dc.subjectSource voltage
dc.subjectSurface profilers
dc.subjectThin-film depositions
dc.subjectDeposition
dc.titleDC microplasma jet for local a: C-H deposition operated in SEM chamber
dc.typeArticle
dc.rights.holderScopus
dc.identifier.bibliograpycitationMicromachines. Vol 8, No.7 (2017)
dc.identifier.doi10.3390/mi8070211
Appears in Collections:Scopus 1983-2021

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