Please use this identifier to cite or link to this item: https://ir.swu.ac.th/jspui/handle/123456789/29509
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dc.contributor.authorFaibut N.
dc.contributor.authorJarernboon W.
dc.contributor.authorHarnchana V.
dc.contributor.authorSupasai T.
dc.contributor.authorRujisamphan N.
dc.contributor.authorPimanpang S.
dc.contributor.authorAmornkitbamrung V.
dc.contributor.otherSrinakharinwirot University
dc.date.accessioned2023-11-15T02:08:47Z-
dc.date.available2023-11-15T02:08:47Z-
dc.date.issued2023
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85171773464&doi=10.1016%2fj.tsf.2023.140048&partnerID=40&md5=1d0bacba135f6bbfeb01b1c0fc69bf0c
dc.identifier.urihttps://ir.swu.ac.th/jspui/handle/123456789/29509-
dc.description.abstractHot-cast CH3NH3PbI3 perovskite thin films are fabricated in ambient air using heated substrates. All the perovskite films prepared are stored in a low-humidity environment. Interestingly, it has been observed that the perovskite films fabricated with high-temperature substrates degrade at a slower rate compared to those prepared at lower temperatures. Even after one week, the morphology of the films remains unchanged when produced with high-temperature substrates under 35–40 % relative humidity (RH). The hot-cast films exhibit p-type characteristics, as evidenced by their surface photovoltage signals. During the aging process, the iodine ions seem to vaporize as evidenced by the reduction of the I/Pb ratios in the energy-dispersive X-ray spectroscopy (EDX) spectra. The hot-cast perovskite films show relatively low surface trap states, ranging from 1015–1016 cm−3, along with low energy band tails of approximately 20 meV. © 2023 Elsevier B.V.
dc.publisherElsevier B.V.
dc.subjectAging effect
dc.subjectHot-casting
dc.subjectMethylammonium lead triiodide
dc.subjectP-type
dc.subjectTrap state density
dc.titleAnomalous p-type characteristic and recrystallization upon aging of hot-cast CH3NH3PbI3 perovskite thin films grown under atmospheric air
dc.typeArticle
dc.rights.holderScopus
dc.identifier.bibliograpycitationThin Solid Films. Vol 783, No. (2023)
dc.identifier.doi10.1016/j.tsf.2023.140048
Appears in Collections:Scopus 2023

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