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Please use this identifier to cite or link to this item: https://ir.swu.ac.th/jspui/handle/123456789/14581
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dc.contributor.authorBuravtsova V.
dc.contributor.authorGan'shina E.
dc.contributor.authorLebedeva E.
dc.contributor.authorSyr'ev N.
dc.contributor.authorTrofimenko I.
dc.contributor.authorVyzulin S.
dc.contributor.authorShipkova I.
dc.contributor.authorPhonghirun S.
dc.contributor.authorKalinin Yu.
dc.contributor.authorSitnikov A.
dc.date.accessioned2021-04-05T03:35:44Z-
dc.date.available2021-04-05T03:35:44Z-
dc.date.issued2011
dc.identifier.issn10120394
dc.identifier.other2-s2.0-79951878861
dc.identifier.urihttps://ir.swu.ac.th/jspui/handle/123456789/14581-
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-79951878861&doi=10.4028%2fwww.scientific.net%2fSSP.168-169.533&partnerID=40&md5=020c7336cc2f6fe9d4e6dd02930293f8
dc.description.abstractMagnetic and magneto-optical properties of multilayers based on the (Co45Fe45Zr10)Z(Al2O 3)100-Z composite and amorphous hydrogenated silicon with various thicknesses both of magnetic and semiconductor layers have been investigated. The nonlinear dependence of magnetic and MO characteristics of the nanostructures on the thickness of layers was found. The interface formed on the boundary of two phases (the ferromagnetic granules and the semiconductor ones) strongly influences the magnetic and MO properties of the structures with thin Si layers.
dc.subjectAmorphous silicon
dc.subjectMagnetic multilayers
dc.subjectMagnetos
dc.subjectMultilayer films
dc.subjectNanocomposites
dc.subjectNanostructured materials
dc.subjectNanostructures
dc.subjectOptical multilayers
dc.subjectOptical properties
dc.subjectPhase interfaces
dc.subjectSemiconducting silicon
dc.subjectSemiconducting silicon compounds
dc.subjectSemiconductor insulator boundaries
dc.subjectZirconium
dc.subjectAlumina
dc.subjectAluminum oxide
dc.subjectAmorphous silicon
dc.subjectFerromagnetic resonance
dc.subjectMagnetic multilayers
dc.subjectMagnetooptical effects
dc.subjectMultilayer films
dc.subjectNanostructures
dc.subjectOptical multilayers
dc.subjectOptical properties
dc.subjectSemiconducting silicon
dc.subjectSemiconductor insulator boundaries
dc.subjectFerromagnetic granules
dc.subjectFMR
dc.subjectHydrogenated silicon
dc.subjectMagnetic and magneto-optical properties
dc.subjectMagnetic and MO properties
dc.subjectMagnetic nanostructures
dc.subjectMagneto-optics
dc.subjectNonlinear dependence
dc.subjectSemiconductor layers
dc.subjectSemiconductor multilayers
dc.subjectSi layer
dc.subjectMagnetism
dc.subjectMagnetism
dc.titleThe features of TKE and FMR in nanocomposite-semiconductor multilayers
dc.typeConference Paper
dc.rights.holderScopus
dc.identifier.bibliograpycitationSolid State Phenomena. Vol 168-169, (2011), p.533-536
dc.identifier.doi10.4028/www.scientific.net/SSP.168-169.533
Appears in Collections:Scopus 1983-2021

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