EMI Filter design part II: Measurement of noise source impedances

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DC Field	Value	Language
dc.contributor.author	Tarateeraseth V.
dc.date.accessioned	2021-04-05T03:34:34Z	-
dc.date.available	2021-04-05T03:34:34Z	-
dc.date.issued	2012
dc.identifier.issn	21622264
dc.identifier.other	2-s2.0-84878794761
dc.identifier.uri	https://ir.swu.ac.th/jspui/handle/123456789/14390	-
dc.identifier.uri	https://www.scopus.com/inward/record.uri?eid=2-s2.0-84878794761&doi=10.1109%2fMEMC.2012.6244944&partnerID=40&md5=febdbc67a5dd6e235d74f110fab0e1ec
dc.description.abstract	In the first part of the EMI filter design series, the conducted EMI generation mechanism was explained. In this second part, a method on the measurement of noise source impedance of SMPS will be described. The proposed measurement method allows accurate extraction of the common-mode and differentialmode equivalent noise source impedances of a SMPS under it actual operating conditions. © 2012 IEEE Electromagnetic Compatibility.
dc.subject	Filter banks
dc.subject	Common mode
dc.subject	Conducted EMI
dc.subject	Differential mode
dc.subject	EMI filter design
dc.subject	Generation mechanism
dc.subject	Measurement methods
dc.subject	Noise source
dc.subject	Operating condition
dc.subject	Shape memory effect
dc.title	EMI Filter design part II: Measurement of noise source impedances
dc.type	Article
dc.rights.holder	Scopus
dc.identifier.bibliograpycitation	IEEE Electromagnetic Compatibility Magazine. Vol 1, No.1 (2012), p.42-49
dc.identifier.doi	10.1109/MEMC.2012.6244944
Appears in Collections:	Scopus 1983-2021

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