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https://ir.swu.ac.th/jspui/handle/123456789/14390| Title: | EMI Filter design part II: Measurement of noise source impedances |
| Authors: | Tarateeraseth V. |
| Keywords: | Filter banks Common mode Conducted EMI Differential mode EMI filter design Generation mechanism Measurement methods Noise source Operating condition Shape memory effect |
| Issue Date: | 2012 |
| Abstract: | In the first part of the EMI filter design series, the conducted EMI generation mechanism was explained. In this second part, a method on the measurement of noise source impedance of SMPS will be described. The proposed measurement method allows accurate extraction of the common-mode and differentialmode equivalent noise source impedances of a SMPS under it actual operating conditions. © 2012 IEEE Electromagnetic Compatibility. |
| URI: | https://ir.swu.ac.th/jspui/handle/123456789/14390 https://www.scopus.com/inward/record.uri?eid=2-s2.0-84878794761&doi=10.1109%2fMEMC.2012.6244944&partnerID=40&md5=febdbc67a5dd6e235d74f110fab0e1ec |
| ISSN: | 21622264 |
| Appears in Collections: | Scopus 1983-2021 |
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