Please use this identifier to cite or link to this item: https://ir.swu.ac.th/jspui/handle/123456789/14272
Title: Effects of annealing temperature on ZnO and AZO films prepared by sol-gel technique
Authors: Ng Z.-N.
Chan K.-Y.
Tohsophon T.
Keywords: Annealing
Atomic force microscopy
Coatings
II-VI semiconductors
Metallic films
Optical properties
Optoelectronic devices
Oxide films
Sol-gel process
Sol-gels
Thin film solar cells
X ray diffraction analysis
Zinc oxide
Annealing temperatures
Other opto-electronic devices
Sol-gel spin coating
Structural and optical properties
Thermal annealing treatment
Thermal-annealing
Thin-film technology
ZnO films
Thin films
Issue Date: 2012
Abstract: Zinc oxide (ZnO) films have the potential in the emerging thin-film technologies which can be employed in thin-film solar cells, transistors, sensors and other optoelectronic devices. In this work, low cost sol-gel spin-coating technique was used to synthesize the ZnO films. The influences of annealing temperature on the structural and optical properties of ZnO and aluminum doped ZnO (AZO) films were investigated. The structural properties of the ZnO films such as surface morphology and crystallinity were determined using atomic force microscopy (AFM) and X-ray diffractometry (XRD), respectively. The optical properties of the ZnO films were characterized by the ultraviolet-visible (UV-vis) spectroscopy and Tauc method was adopted to estimate the optical gap. The experimental results reveal that the thermal annealing treatment affects the properties of the ZnO films. The effects of the low range annealing temperature on the sol-gel ZnO films addressed in this investigation will be discussed in this paper. © 2012 Elsevier B.V.
URI: https://ir.swu.ac.th/jspui/handle/123456789/14272
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84864684228&doi=10.1016%2fj.apsusc.2012.05.156&partnerID=40&md5=5ca920f584e5f9a938ca9a302b250248
ISSN: 1694332
Appears in Collections:Scopus 1983-2021

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