Please use this identifier to cite or link to this item:
https://ir.swu.ac.th/jspui/handle/123456789/14181
Title: | Synthesis and characterization of filtered-cathodic-vacuum-arc-deposited TiO2 films for photovoltaic applications |
Authors: | Aramwit C. Intarasiri S. Bootkul D. Tippawan U. Supsermpol B. Seanphinit N. Ruangkul W. Yu L.D. |
Keywords: | Atomic force microscopy Deposition Energy dispersive spectroscopy Nanostructured materials Oxide minerals Scanning electron microscopy Solar cells Titanium Titanium dioxide Vacuum applications Vacuum technology X ray spectroscopy Energy dispersive X ray spectroscopy Filtered cathodic vacuum arc Filtered cathodic vacuum arc deposition Nanoporous anatase Performance efficiency Photocatalytic materials Photovoltaic applications Synthesis and characterizations Dye-sensitized solar cells |
Issue Date: | 2013 |
Abstract: | Titanium dioxide (TiO2) is well-known as a photovoltaic and photocatalytic material. For improvement in the dye-sensitized solar cell (DSSC) performance efficiency, the photocatalyst TiO2 layer would be desired in nanoporous anatase. In this research, TiO2 films were synthesized on glass or p-type silicon substrate using our in-house Filtered Cathodic Vacuum Arc Deposition (FCVAD) system. The deposition was operated at varied oxygen (O2) partial pressures of 10-4, 10 -3, 10-2 to 10-1 torr with fixed 0 or 250-V bias and 600-V arc for 10 or 20 minutes. The film transparency increased with increasing of the O2 pressure, indicating increase in the structure required for applications in dye-sensitized solar cells. The films were characterized using the Energy-Dispersive X-ray spectroscopy (EDS) and Raman spectroscopy techniques. The EDS confirmed that the transparent deposited films contained stoichiometric titanium and oxygen under the medium O2 pressure. Raman spectra confirmed that the films were TiO2 containing some rutile but no anatase which needed annealing to form. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) were used for evaluation of the film's surface morphology and thickness. The result showed that increasing of the O2 pressure decreased the thickness to a nanoscale but increased the amount of TiO2. © IOP Publishing Ltd 2013. |
URI: | https://ir.swu.ac.th/jspui/handle/123456789/14181 https://www.scopus.com/inward/record.uri?eid=2-s2.0-84876847339&doi=10.1088%2f1742-6596%2f423%2f1%2f012005&partnerID=40&md5=9146598672775e30812893edbc711892 |
ISSN: | 17426588 |
Appears in Collections: | Scopus 1983-2021 |
Files in This Item:
There are no files associated with this item.
Items in SWU repository are protected by copyright, with all rights reserved, unless otherwise indicated.