Please use this identifier to cite or link to this item: https://ir.swu.ac.th/jspui/handle/123456789/13524
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dc.contributor.authorPokai S.
dc.contributor.authorLimnonthakul P.
dc.contributor.authorHorprathum M.
dc.contributor.authorKalasung S.
dc.contributor.authorEiamchai P.
dc.contributor.authorLimwichean S.
dc.contributor.authorNuntawong N.
dc.contributor.authorPattantsetakul V.
dc.contributor.authorTuscharoen S.
dc.contributor.authorKaewkhao J.
dc.date.accessioned2021-04-05T03:24:25Z-
dc.date.available2021-04-05T03:24:25Z-
dc.date.issued2016
dc.identifier.issn10139826
dc.identifier.other2-s2.0-84958212317
dc.identifier.urihttps://ir.swu.ac.th/jspui/handle/123456789/13524-
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84958212317&doi=10.4028%2fwww.scientific.net%2fKEM.675-676.53&partnerID=40&md5=2a49f6894c1e590a9f91d2d3d988bcbd
dc.description.abstractZinc oxide (ZnO) nanorods (NRs) promise high potentials in several applications, such as photovoltaic device, thermoelectric device, sensor and solar cell. In this research, the vertical alignment of ZnO NRs was fabricated by hydrothermal method with various precursor concentrations and growth time on different seed layers (ZnO and Au), which deposited on silicon wafer substrate (100). The crystalline structure and morphology of ZnO NRs have been characterized by x-ray diffraction (XRD) and field emission scanning electron microscopy (FE-SEM) techniques, respectively. The x-ray diffraction pattern shows that the prepared samples have a strong preferred orientation (002) plane. FE-SEM images of the ZnO NRs, it found that the density and aspect ratio were strongly influenced by the seed layer and precursor concentration. In addition, the aspect ratio of ZnO NRs was increased with increasing growth time. This study provides a cost effective method for the fabrication of well aligned ZnO NRs for nano-electronic devices. © 2016 Trans Tech Publications, Switzerland.
dc.subjectAspect ratio
dc.subjectCost effectiveness
dc.subjectEnamels
dc.subjectField emission microscopes
dc.subjectGold compounds
dc.subjectGold deposits
dc.subjectMorphology
dc.subjectNanoelectronics
dc.subjectNanorods
dc.subjectScanning electron microscopy
dc.subjectSilicon wafers
dc.subjectSolar cells
dc.subjectSolar power generation
dc.subjectTemperature
dc.subjectX ray diffraction
dc.subjectZinc oxide
dc.subjectCost-effective methods
dc.subjectField emission scanning electron microscopy
dc.subjectGrowth conditions
dc.subjectHydrothermal
dc.subjectLow-temperature hydrothermal methods
dc.subjectPrecursor concentration
dc.subjectPreferred orientations
dc.subjectSilicon wafer substrates
dc.subjectII-VI semiconductors
dc.titleInfluence of growth conditions on morphology of ZnO nanorods by low-temperature hydrothermal method
dc.typeConference Paper
dc.rights.holderScopus
dc.identifier.bibliograpycitationKey Engineering Materials. Vol 675-676, (2016), p.53-56
dc.identifier.doi10.4028/www.scientific.net/KEM.675-676.53
Appears in Collections:Scopus 1983-2021

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