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Dynamic self-organized learning for optimizing the complexity growth of radial basis function neural networks

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dc.contributor.author Arisariyawong S.
dc.contributor.author Charoenseang S.
dc.date.accessioned 2021-04-05T04:33:09Z
dc.date.available 2021-04-05T04:33:09Z
dc.date.issued 2002
dc.identifier.other 2-s2.0-33746931769
dc.identifier.uri https://ir.swu.ac.th/jspui/handle/123456789/15239
dc.identifier.uri https://www.scopus.com/inward/record.uri?eid=2-s2.0-33746931769&doi=10.1109%2fICIT.2002.1189980&partnerID=40&md5=e4623b874ad954130dec341abbd17ba2
dc.description.abstract This paper proposes a framework of automatically exploring the optimal size of a radial basis function (RBF) neural network. A dynamic self-organized learning algorithm is presented to adapt the structure of the network. The algorithm generates a new hidden unit based on the steady state error of network and the nearest distance from input data to the center of hidden unit. Furthermore, it also detects and removes any insignificant contributing hidden units. For optimizing the complexity growth of RBF neural network, the growing and pruning are combined during adaptation of RBF neural network structure. The examples of nonlinear dynamical system modeling are presented to illustrate the performance of the proposed algorithm. © 2002 IEEE.
dc.subject Algorithms
dc.subject Complex networks
dc.subject Dynamical systems
dc.subject Functions
dc.subject Learning algorithms
dc.subject Nonlinear dynamical systems
dc.subject Robotics
dc.subject Convergence
dc.subject Function estimation
dc.subject Growing and pruning
dc.subject Nonlinear dynamical system modeling
dc.subject Radial basis function neural networks
dc.subject RBF Neural Network
dc.subject Self organized learning
dc.subject Steady state errors
dc.subject Radial basis function networks
dc.title Dynamic self-organized learning for optimizing the complexity growth of radial basis function neural networks
dc.type Conference Paper
dc.rights.holder Scopus
dc.identifier.bibliograpycitation Proceedings of the IEEE International Conference on Industrial Technology. Vol 1, (2002), p.655-660
dc.identifier.doi 10.1109/ICIT.2002.1189980


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